Title :
On clone assembly problems: an error-tolerant test for interval graphs
Author :
Hsu, Wen-Lian ; Lu, Wei-Fu
Author_Institution :
Inst. of Inf. Sci., Acad. Sinica, Taipei, Taiwan
Abstract :
An important problem in DNA physical mapping is to reassemble the clone fragments to determine the structure of the entire molecule. The error-free version of this problem can be modeled as an interval graph recognition problem, where an interval graph is the intersection graph of a collection of intervals. However, since the data collected from laboratories almost surely contain some errors, traditional recognition algorithms can hardly be applied directly. We present a new test which has the following features: 1) the algorithm assembles the clones efficiently when the data is error-free; 2) in a case when the error rate is small (say, less than 3%) the test can likely detect and automatically correct the following three types of errors false positives, false negatives and chimeric clones; and 3) the test also identifies those parts of the data that are problematic, thus allowing biologists to perform further experiments to clean up the data
Keywords :
DNA; biology computing; computational complexity; error correction; error detection; graph theory; molecular biophysics; DNA physical mapping; biology; clone assembly; computational complexity; error correction; error detection; error-tolerant algorithm; interval graphs; undirected graph; Assembly; Cloning; Testing;
Conference_Titel :
Intelligence and Systems, 1998. Proceedings., IEEE International Joint Symposia on
Conference_Location :
Rockville, MD
Print_ISBN :
0-8186-8548-4
DOI :
10.1109/IJSIS.1998.685428