DocumentCode :
3244352
Title :
How International Standards Such as ATML and IEEE 1641 STD can Make the Realisation of an Open System Architecture on a Common Test Platform a Reality
Author :
Gorringe, Chris
Author_Institution :
EADS Test & Services (UK) Ltd., Wimborne
fYear :
2006
fDate :
18-21 Sept. 2006
Firstpage :
731
Lastpage :
738
Abstract :
A perspective on how the DoD and MoD are integrating open standards into their ATS frameworks and policy in the search for a common test platform architecture solution for use on all test platforms. The paper examines the two approaches being taken and draws on their commonality to propose how open standards can help meet both their aims and circumstances. Benefits such as TPS interoperability, re-host and re-use are examined and contrasted for open systems versus common architecture to identify the practical implication for real systems. The life cycle cost of support for the system is identified and the trade-off in cost between fast optimal TPSs and fully interoperable TPSs is considered. The paper goes on to show the difference between using information models utilizing a development process versus the use of run time interfaces and how they can lead to different solutions to the same basic problem but with different peripheral benefits. In conclusion an approach to maximize benefit between the two framework groups is considered whilst maintaining individual priorities.
Keywords :
IEEE standards; automatic test equipment; military systems; software architecture; ATML; ATS frameworks; DoD; IEEE 1641 STD; MoD; common test platform architecture; international standards; life cycle support cost; open system architecture; run time interfaces; Automatic testing; Computer industry; Cost function; Defense industry; Logistics; Open systems; Software standards; Software testing; Standards organizations; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autotestcon, 2006 IEEE
Conference_Location :
Anaheim, CA
ISSN :
1088-7725
Print_ISBN :
1-4244-0051-1
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2006.283756
Filename :
4062469
Link To Document :
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