Title :
Automatic core segmentation and registration for fast tissue microarray de-arraying
Author :
Nguyen, Hoai-Nam ; Kervrann, Charles ; Cauchois, Cyril ; Paveau, Vincent
Author_Institution :
Inria Rennes, Campus Univ. de Beaulieu, Rennes, France
Abstract :
Tissue core de-arraying is one of the most important steps in tissue microarray (TMA) image analysis. However, few solutions and mathematical frameworks are available. This paper presents a robust TMA de-arraying method adapted for digital images from classical optical and new fluorescent devices. The proposed algorithm is composed of three modules: (a) detection, (b) segmentation, and (c) array indexing. The detection of TMA cores is performed by local adaptive thresholding of isotropic wavelet transform coefficients. The segmentation component uses parametric ellipse to delineate the boundaries of potential tissue cores. Array indices of each core are computed by using thin-plate splines to estimate the deformation of the deposited core grid. Our method is appropriate for non-linear deformation and is able to quantify the deformation of TMA grids when compared to existing algorithms.
Keywords :
biological tissues; biomedical optical imaging; fluorescence; image registration; image segmentation; medical image processing; wavelet transforms; TMA core detection; TMA dearraying method; TMA grid deformation; array indexing; array indices; automatic core registration; automatic core segmentation; classical optical devices; deposited core grid deformation; digital images; fluorescent devices; isotropic wavelet transform coefficients; local adaptive thresholding; nonlinear deformation; parametric ellipse; segmentation component; thin-plate splines; tissue core microarray dearraying; tissue microarray image analysis; Approximation methods; Arrays; Biological tissues; Image segmentation; Indexing; Wavelet transforms; TMA de-arraying; Tissue microarray; isotropic wavelet transform; parametric ellipse-based segmentation; thin-plate splines;
Conference_Titel :
Biomedical Imaging (ISBI), 2015 IEEE 12th International Symposium on
Conference_Location :
New York, NY
DOI :
10.1109/ISBI.2015.7164147