DocumentCode
3244514
Title
Query movement by sensitivity of similarity measure
Author
Lin, Xian-Yan ; Li, Hao-Tian ; Yin, Shao-Hua
Author_Institution
Sch. of Comput. Sci. & Eng., South China Univ. of Technol., Guangzhou, China
fYear
2012
fDate
15-17 July 2012
Firstpage
68
Lastpage
72
Abstract
In Content Based Image Retrieval (CBIR) system, Relevance Feedback (RF) technique can substantially promote retrieval accuracy. As a popular algorithm of Relevance Feedback, Query movement was widely applied in this area and it moves the query in the input space towards relevant images. However, traditional Query Movement algorithm has significant disadvantages. It is to reduce the similarity between the query image and irrelevant images and increase similarity between the query image and relevant images. However, the magnitudes of increment or decrement of similarity differ for different images. Some sensitive images in the database may yield more increment or decrement of the similarity of the query image. In this work, we propose a sample sensitivity based query movement. Sensitive images in the database will contribute more to the movement of query. The sensitivity of image is measured by a stochastic sensitivity of the similarity measure for abstract unseen images located within a Q-neighborhood of an image. Experimental results show that the proposed method outperforms simple query movement without sensitivity.
Keywords
content-based retrieval; image retrieval; relevance feedback; stochastic processes; visual databases; CBIR system; RF technique; abstract unseen images; content based image retrieval system; image Q-neighborhood; image database; irrelevant images; query image; query movement algorithm; relevance feedback technique; sensitive images; similarity decrement; similarity increment; similarity measure; similarity measure sensitivity; stochastic sensitivity; Educational institutions; Image retrieval; Pattern recognition; Radio frequency; Sensitivity; Wavelet analysis; CBIR; Image Retrieval; Query Movement; Relevance Feedback; Sensitivity Measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Wavelet Analysis and Pattern Recognition (ICWAPR), 2012 International Conference on
Conference_Location
Xian
ISSN
2158-5695
Print_ISBN
978-1-4673-1534-0
Type
conf
DOI
10.1109/ICWAPR.2012.6294757
Filename
6294757
Link To Document