• DocumentCode
    3244598
  • Title

    Boundary Scan for Structural Board Test on LXI Platform

  • Author

    Ehrenberg, Heiko ; Wenzel, Thomas

  • Author_Institution
    GOEPEL Electron. LLC, Austin, TX
  • fYear
    2006
  • fDate
    18-21 Sept. 2006
  • Firstpage
    789
  • Lastpage
    794
  • Abstract
    JTAG/Boundary Scan tools for LXI1 allow a powerful and flexible combination with other test methodologies. This paper shortly discusses benefits and shortcomings of JTAG/Boundary Scan and Functional Test and then outlines possibilities of integrating Boundary Scan tools in a LXI based test environment. Advantages of such a combination of Boundary Scan and Functional Test equipment are illustrated. Furthermore, an introduction to JTAG/ Boundary Scan related Design-For-Testability will be provided.
  • Keywords
    boundary scan testing; design for testability; JTAG/boundary scan tools; LAN extension for instrumentation; LXI based test environment; design for testability; functional test equipment; structural board test; Automatic programming; Automatic testing; Circuit testing; Electronic equipment testing; Local area networks; Logic programming; Logic testing; Manufacturing; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Autotestcon, 2006 IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    1088-7725
  • Print_ISBN
    1-4244-0051-1
  • Electronic_ISBN
    1088-7725
  • Type

    conf

  • DOI
    10.1109/AUTEST.2006.283765
  • Filename
    4062478
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3244598