Title :
Performance of TMS and TMG for particle detector
Author :
Hosh, Y. ; Yuta, H. ; Masuda, K.
Author_Institution :
Dept. of Appl. Phys., Tohoku Gakuin Univ., Tagajo, Japan
Abstract :
We present the results of an extensive study of the response of TMS and TMG for particle detector application. The energy resolutions of 976 keV conversion electrons from a 207Bi source are measured in a gridded ionization chamber filled with TMS (tetramethylsilane) and TMG (tetramethylgermanium), and are found to be about 5.7 and 5.5% (rms), respectively. We also deduce a simple method of estimating the electron lifetime using a gridded ionization chamber. The free-ion yield and electron lifetime for these liquids are estimated by this simple method to be 2.64, 2.78 and 16.89 μs, 15.40 μs, respectively. The radiation damage of both liquids is examined by measuring the electron lifetime as a function of accumulated radiation dose in a parallel plate ionization chamber. The electron lifetime for the damaged liquid almost recovers to its initial value after repeating the purification. Also, we present preliminary results of the investigation of recombination light from a 241Am source in TMG, which directly affects the charge collection for the ionization
Keywords :
carrier lifetime; gamma-ray detection; gamma-ray effects; liquid ionisation chambers; organic compounds; particle calorimetry; 1 to 1E4 gray; 15.4 mus; 16.89 mus; 976 keV; 207Bi source; 241Am source; TMG; TMS; accumulated radiation dose; conversion electron energy resolution; electron lifetime; free-ion yield; gridded ionization chamber; ionization charge collection; parallel plate ionization chamber; particle calorimeter; particle detector; radiation damage; recombination light; tetramethylgermanium; tetramethylsilane; Bismuth; Electrons; Energy measurement; Energy resolution; Ionization chambers; Ionizing radiation; Life estimation; Lifetime estimation; Liquids; Radiation detectors;
Conference_Titel :
Dielectric Liquids, 1999. (ICDL '99) Proceedings of the 1999 IEEE 13th International Conference on
Conference_Location :
Nara
Print_ISBN :
0-7803-4759-5
DOI :
10.1109/ICDL.1999.798935