Author_Institution :
Integrated Sensor Solutions Inc., San Jose, CA, USA
Abstract :
Innovative circuit design techniques based on standard CMOS wafer fabrication processes are enabling sensor products to incorporate a higher level of intelligence while simultaneously reducing cost and product size. Error correction and output calibration for sensor products has traditionally been implemented by laser trimming thick film passive components in a hybrid circuit containing discrete components for signal conditioning. This “analog trimming” approach has many limitations, including high labour and material costs since the process is manual, limited product accuracy, large physical size, high component count and long term performance drifts. ISS has developed a new approach to sensor signal conditioning that is based on “electronic trimming.” In this “one sensor, one ASIC” approach, a fully integrated, single chip integrated circuit replaces a hybrid circuit containing many passive components. Digital calibration coefficients, stored in on-chip non-volatile memory, eliminate the need for external components or laser trimming. As a result, there are dramatic improvements in performance and cost
Keywords :
CMOS integrated circuits; EPROM; calibration; error correction; integrated circuit reliability; intelligent sensors; mixed analogue-digital integrated circuits; CMOS IC; digital calibration coefficients; electronic trimming; error correction; onchip nonvolatile memory; output calibration; single chip ASICs; smart sensor signal conditioning; CMOS process; Calibration; Circuit synthesis; Costs; Error correction; Intelligent sensors; Laser theory; Optical device fabrication; Thick film sensors; Thick films;