DocumentCode :
3245627
Title :
Waveform analysis of 40-Hz auditory steady-state response using wavelet analysis
Author :
Ikawa, Nobuko ; Morimoto, Akira ; Ashino, Ryuichi
Author_Institution :
Fac. of Law, Ryutsu Keizai Univ., Ryugasaki, Japan
fYear :
2012
fDate :
15-17 July 2012
Firstpage :
397
Lastpage :
402
Abstract :
A new design based on wavelet analysis for the objective audiometry devices is proposed. The auditory brainstem response and 80-Hz auditory steady-state response (ASSR) are used in the objective audiometry devices for infants. For the aged, an objective audiometry device is used in anti-aging investigations, which enables the hearing acuity of awake adults to be tested with the 40-Hz ASSR. The ASSR evoked by an amplitude modulated tone is recorded as a waveform. However, the evoked potential response is very small. Therefore, it is difficult to decide a threshold of the response and whether a significant response exists when it is mixed with noise such as the background brain waves. To cope with this problem, we need to average the evoked response waveforms. In particular, the 40-Hz ASSR has a large amount of noise caused by the background brain waves in comparison with the 80-Hz ASSR. In this paper, we apply waveform analysis using the wavelet transform in order to extract the 40-Hz ASSR from a signal mixed with a large amount of noise. Subjects with normal hearing participated in this study.
Keywords :
amplitude modulation; auditory evoked potentials; brain; waveform analysis; wavelet transforms; ASSR; amplitude modulated tone recording; antiaging investigation; auditory brainstem response; auditory steady-state response; background brain wave; evoked potential response waveform; frequency 40 Hz; frequency 80 Hz; hearing acuity; infant; objective audiometry device; waveform analysis; wavelet analysis; wavelet transform; Argon; Auditory system; Discrete wavelet transforms; Frequency modulation; Noise; Steady-state; Wavelet analysis; 40-Hz auditory steady-state response; Wave analysis; Wavelet multiresolution analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wavelet Analysis and Pattern Recognition (ICWAPR), 2012 International Conference on
Conference_Location :
Xian
ISSN :
2158-5695
Print_ISBN :
978-1-4673-1534-0
Type :
conf
DOI :
10.1109/ICWAPR.2012.6294814
Filename :
6294814
Link To Document :
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