DocumentCode
3245883
Title
[Front matter]
fYear
2012
fDate
4-6 July 2012
Firstpage
1
Lastpage
2
Abstract
The following topics are dealt with: oxide thin-film transistor reliability; fabrication processing; thin-film materials; transparent conductive films; organic TFT reliability; thin-film photovoltaics; flat panel displays; and silicon thin-film transistor reliability.
Keywords
elemental semiconductors; flat panel displays; organic field effect transistors; organic semiconductors; semiconductor device reliability; semiconductor growth; semiconductor thin films; silicon; thin film transistors; Si; active-matrix flatpanel displays; fabrication processing; flat panel displays; international workshop; organic thin-film transistor reliability; oxide thin-film transistor reliability; silicon thin-film transistor reliability; thin-film materials; thin-film photovoltaics; transparent conductive films;
fLanguage
English
Publisher
ieee
Conference_Titel
Active-Matrix Flatpanel Displays and Devices (AM-FPD), 2012 19th International Workshop on
Conference_Location
Kyoto
Print_ISBN
978-1-4673-0399-6
Type
conf
Filename
6294828
Link To Document