Title :
The dielectric relaxation studies in liquid crystals
Author :
Johri, G.K. ; Johri, Manoj ; Srivststava, R. ; Roberts, J.A.
Author_Institution :
Dept. of Phys. & Electron., DAV Coll., Kanpur, India
Abstract :
Experimental studies of the dielectric response in liquid crystals at different temperatures have been performed using a microwave cavity spectrometer. The data on the width of the resonant profile and the shift of the resonant frequency observed are analysed to determine permittivity, dielectric loss, and relaxation time mechanism. The relative variation of the dielectric loss has been measured at different temperatures to monitor the phase changes. This work provides useful information about the macroscopic structure of the liquid crystals
Keywords :
dielectric losses; dielectric relaxation; liquid crystal phase transformations; molecular orientation; nematic liquid crystals; permittivity; HCB; PCB; dielectric loss; dielectric response; liquid crystals; macroscopic structure; microwave cavity spectrometer; nematic phase; permittivity; phase changes; relaxation time mechanism; resonant frequency shift; resonant profile width; temperature dependence; Dielectric liquids; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electrochemical impedance spectroscopy; Liquid crystals; Permittivity; Resonance; Resonant frequency; Temperature measurement;
Conference_Titel :
Dielectric Liquids, 1999. (ICDL '99) Proceedings of the 1999 IEEE 13th International Conference on
Conference_Location :
Nara
Print_ISBN :
0-7803-4759-5
DOI :
10.1109/ICDL.1999.798998
