Title :
Confidence scoring for ANN-based spoken language understanding
Author :
Wutiwiwatchai, Chai ; Furui, Sadaoki
Author_Institution :
Dept. of Comput. Sci., Tokyo Inst. of Technol., Japan
fDate :
30 Nov.-3 Dec. 2003
Abstract :
We present an efficient way for confidence scoring in a new spoken language understanding (SLU) approach. The SLU system is based on a combination of weighted finite state automata and an artificial neural network (ANN). Given an input sentence, the system extracts a set of semantic frames, called concepts, and a user intention, called a goal. The confidence scoring is applied for detecting the goals misclassified by the neural network. A set of confidence features is derived from the outcomes of the SLU system, and is automatically selected for confidence scoring. Two classifiers, Fisher linear discriminant analysis and support vector machines (SVM), are compared. Experiments show that when we evaluate on a speech-recognized sentence set that contains about 23% word errors, the SVM achieves over 70% correct rejection of misunderstood sentences at 93% correct acceptance rate.
Keywords :
finite state machines; interactive systems; iterative methods; learning (artificial intelligence); natural languages; neural nets; pattern classification; speech recognition; speech-based user interfaces; support vector machines; vocabulary; Fisher linear discriminant analysis; artificial neural network; concepts; confidence features; confidence scoring; iterative training; misclassified goals; misunderstood sentences; semantic frames; speech-recognized sentence set; spoken dialogue system; spoken language understanding; support vector machines; user intention; weighted finite state automata; Artificial neural networks; Automata; Computer science; Error analysis; Error correction; Linear discriminant analysis; Natural languages; Speech recognition; Support vector machine classification; Support vector machines;
Conference_Titel :
Automatic Speech Recognition and Understanding, 2003. ASRU '03. 2003 IEEE Workshop on
Print_ISBN :
0-7803-7980-2
DOI :
10.1109/ASRU.2003.1318502