Title :
Composite attribute method and software to interlock semiconductor product design and manufacturing yield
Author :
Bickford, Jeanne P. ; Rolfing, Lori ; Sullivan, Candance ; They, Carlos ; Wolf, Edward M. ; Yoder, Joseph W. ; Niekrewicz, Paul
Author_Institution :
Custom Logic, IBM Syst. & Technol. Group, Essex Junction, VT, USA
Abstract :
Semiconductor product design content changes in recent technology nodes significantly changes yield even when the same die size is maintained. A method and software has been developed and implemented in IBM´s 32 and 14nm ASIC products to track yield impacts related to content change throughout the design process so that unexpected cost impacts can be avoided.
Keywords :
application specific integrated circuits; integrated circuit yield; IBM ASIC products; composite attribute method; interlock semiconductor product design; manufacturing yield; size 14 nm; size 32 nm; yield impacts; Circuit faults; Libraries; Logic gates; Manufacturing; Product design; Redundancy; Yield estimation; circuit content; design changes; yield;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2015 26th Annual SEMI
Conference_Location :
Saratoga Springs, NY
DOI :
10.1109/ASMC.2015.7164432
