Title :
In-situ Charge Observation in Insulation Layers of Metal-base Printed Circuit Boards
Author :
Okamoto, K. ; Fukunaga, K. ; Maeno, Takashi
Author_Institution :
Production Technol. Lab., Fuji Electr. Adv. Technol. Co. Ltd., Tokyo
Abstract :
We have developed in-situ space charge measurement system during ageing tests of printed circuit boards by the pulsed electroacoustic method. It can observe space charge profiles at 358 K (85degC) and 85%RH. Experimental results suggest that internal space charge behaviour is strongly affected by the humidity. This technique should contribute to evaluate test methods of insulation layers as well as to investigate the ageing process
Keywords :
ageing; charge measurement; humidity; insulation testing; printed circuit testing; pulsed electroacoustic methods; space charge; 358 K; 85 C; ageing tests; humidity; in-situ charge observation; insulation layers; internal space charge behaviour; metal-base printed circuit boards; pulsed electroacoustic method; space charge measurement system; space charge profiles; Aging; Charge measurement; Circuit testing; Current measurement; Insulation; Printed circuits; Pulse measurements; Pulsed electroacoustic methods; Space charge; System testing;
Conference_Titel :
Properties and applications of Dielectric Materials, 2006. 8th International Conference on
Conference_Location :
Bali
Print_ISBN :
1-4244-0189-5
Electronic_ISBN :
1-4244-0190-9
DOI :
10.1109/ICPADM.2006.284122
