Title : 
Fault-tolerance of a neural network solving the TSP
         
        
            Author : 
Protzel, Peter ; Palumbo, D. ; Arras
         
        
            Author_Institution : 
NASA Langley Res. Center, Hampton, VA, USA
         
        
        
        
            Abstract : 
Summary form only given, as follows. Results are presented of a fault-injection experiment that simulates a neural network solving the traveling salesman problem (TSP). The network is based on a modified version of Hopfield´s and Tank´s original method. The authors define a performance characteristic for the TSP that allows an overall assessment of the solution quality for different city distributions and problem sizes. Five different 10-, 20-, and 30-city cases are used for the injection of up to 13 simultaneous stuck-at-0 and stuck-at-1 faults. The results of more than 4000 simulation runs show the extreme fault tolerance of the network, especially with respect to stuck-at-0 faults. One possible explanation for the overall surprising result is the redundancy of the problem representation.<>
         
        
            Keywords : 
fault tolerant computing; neural nets; operations research; virtual machines; Hopfield-Tank network; fault tolerance; fault-injection experiment; neural network; operations research; redundancy; stuck-at-0 faults; stuck-at-1 faults; traveling salesman problem; Computer fault tolerance; Neural networks; Operations research; Virtual computers;
         
        
        
        
            Conference_Titel : 
Neural Networks, 1989. IJCNN., International Joint Conference on
         
        
            Conference_Location : 
Washington, DC, USA
         
        
        
            DOI : 
10.1109/IJCNN.1989.118369