DocumentCode :
3246660
Title :
Rotation and illumination invariant texture analysis: Matching clothes with complex patterns for blind people
Author :
Shuai Yuan ; YingLi Tian
Author_Institution :
Dept. of Electr. Eng., City Coll. of New York, New York, NY, USA
Volume :
6
fYear :
2010
fDate :
16-18 Oct. 2010
Firstpage :
2643
Lastpage :
2647
Abstract :
Matching clothes is a challenging task for blind people. In this paper, we describe a new texture analysis approach which is robust to variations of rotation and illumination for matching two images of clothes with complex patterns. The approach integrates Radon transform, wavelet transform, and co-occurrence matrix for texture analysis of clothes images. We first calculate directional properties of texture pattern in each image by applying Radon transform. The directional properties are used to rotate the clothes image with the dominant orientation of the texture patterns as horizontal. To handle illumination changes, we perform Haar wavelet transform to extract texture features on three directions (horizontal, vertical and diagonal). For each wavelet sub image, grey level cooccurrence matrix for texture analysis is calculated. Finally, texture matching is performed based on six statistical features (i.e. mean, variance, smoothness, energy, homogeneity, and entropy). The robustness and effectiveness of the proposed method are evaluated on our database which contains 128 images of complex pattern clothes. The matching results are presented for blind users as speech outputs.
Keywords :
Haar transforms; Radon transforms; feature extraction; handicapped aids; image texture; matrix algebra; wavelet transforms; Haar wavelet transform; Radon transform; blind people; clothes matching; cooccurrence matrix; illumination invariant texture analysis; rotation invariant texture analysis; texture feature extraction; texture pattern; Feature extraction; Lighting; Pattern matching; Pixel; Wavelet analysis; Wavelet transforms; Co-occurrence matrix; Radon transform; clothes matching; texture analysis; wavelet transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image and Signal Processing (CISP), 2010 3rd International Congress on
Conference_Location :
Yantai
Print_ISBN :
978-1-4244-6513-2
Type :
conf
DOI :
10.1109/CISP.2010.5646237
Filename :
5646237
Link To Document :
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