• DocumentCode
    3246760
  • Title

    A framework for the analysis and design of algorithms for a class of VLSI-CAD optimization problems

  • Author

    Shi, C.-J. ; Brzozowski, J.A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
  • fYear
    1995
  • fDate
    29 Aug-1 Sep 1995
  • Firstpage
    67
  • Lastpage
    74
  • Abstract
    A simple mathematical framework, called cluster-cover, is established for several VLSI optimisation problems including logic minimization, constrained encoding, multi-layer topological planar routing, application timing assignment for delay-fault testing, and minimization of monitoring logic for BIST enhancement. Two paradigms, prime covering and greedy peeling, are presented for developing both exact and heuristic algorithms. The paradigms capture generally applicable ingredients from previously developed algorithms for individual applications. This makes it possible to re-use established techniques in new problems, and provide new insights into existing problems. The paradigms are simple enough to be amenable to theoretical analysis. Bounds on the performance of greedy peeling are derived; these bounds are applicable to many published heuristics which previously could be evaluated only by benchmarks
  • Keywords
    VLSI; logic CAD; logic design; minimisation of switching nets; BIST enhancement; VLSI optimisation; VLSI-CAD; application timing assignment; cluster-cover; constrained encoding; delay-fault testing; greedy peeling; logic minimization; multi-layer topological planar routing; prime covering; Algorithm design and analysis; Clustering algorithms; Constraint optimization; Delay; Encoding; Logic testing; Minimization; Routing; Timing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1995. Proceedings of the ASP-DAC '95/CHDL '95/VLSI '95., IFIP International Conference on Hardware Description Languages. IFIP International Conference on Very Large Scal
  • Conference_Location
    Chiba
  • Print_ISBN
    4-930813-67-0
  • Type

    conf

  • DOI
    10.1109/ASPDAC.1995.486204
  • Filename
    486204