DocumentCode
32468
Title
Study on the Optimization for Current Spreading Effect of Lateral GaN/InGaN LEDs
Author
Chi-kang Li ; Rosmeulen, M. ; Simoen, Eddy ; Yuh-Renn Wu
Author_Institution
Inst. of Photonics & Optoelectron. & Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume
61
Issue
2
fYear
2014
fDate
Feb. 2014
Firstpage
511
Lastpage
517
Abstract
This paper exhibits systematic results for lateral light emitting diodes (LEDs) with various conditions. The simulation results and circuit model are both included to describe the current spreading effect at the same time. A fully 2-D model that solves Poisson and drift-diffusion equations to investigate the current flow and radiative recombination distribution specifies the uniformity of the carrier distribution, which is combined with the Monte Carlo ray tracing technique to calculate the light extraction efficiency (LEE). This paper focuses on the modulation of the transparent conducting layer. In addition, this paper will discuss bottom emission LEDs addressing the current spreading effect and LEE compared with top emission LEDs. We also examine the droop effect to verify our discussion. A thorough analysis provides deep insights for achieving high efficiency lateral LEDs.
Keywords
III-V semiconductors; Monte Carlo methods; Poisson equation; gallium compounds; indium compounds; light emitting diodes; optimisation; ray tracing; wide band gap semiconductors; GaN-InGaN; LEE; Monte Carlo ray tracing; Poisson equation; carrier distribution; current flow; current spreading effect; drift-diffusion equation; droop effect; lateral GaN-InGaN LED; light emitting diodes; light extraction efficiency; optimization; radiative recombination distribution; Charge carrier processes; Current density; Integrated circuit modeling; Light emitting diodes; Mathematical model; Radiative recombination; Resistance; Auger recombination; InGaN; current spreading; droop; efficiency; lateral light emitting diode (LED); light extraction; overflow;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2013.2294534
Filename
6689299
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