DocumentCode
3247077
Title
Partial Discharge Classification on High Voltage Equipment with K-Means
Author
Chatpattananan, V. ; Pattanadech, N. ; Yutthagowith, P.
Author_Institution
Fac. of Eng., King Mongkut´´s Inst. of Technol., Bangkok
fYear
2006
fDate
38869
Firstpage
191
Lastpage
194
Abstract
This document proposes a statistical classification model using k-means cluster analysis to classify partial discharge (PD) patterns into four categories listed as corona at high voltage side in air, corona at low voltage side in air, surface in air, and internal discharge. The independent variables in this k-means cluster analysis model are skewness, kurtosis, asymmetry, and cross correlation following the (phi)-q-n PD patterns obtained from the fingerprint analysis which is a digital signal processing technique for PD measurement. The experiments were set to simulate all four PD patterns to obtain statistical parameters into 10 independent variables from the fingerprint analysis. This document recommends using 8 final clusters instead of using 4 final clusters to achieve the accuracy of using this k-means cluster approach to 100 percent
Keywords
correlation methods; high-voltage engineering; insulating materials; insulation testing; partial discharge measurement; pattern classification; pattern clustering; power apparatus; signal classification; statistical analysis; PD measurement; cross correlation; digital signal processing technique; fingerprint analysis; high-voltage equipment; insulating material; k-means cluster analysis; kurtosis; partial discharge pattern classification; skewness; statistical classification model; Analytical models; Corona; Digital signal processing; Fingerprint recognition; Low voltage; Partial discharges; Pattern analysis; Signal analysis; Surface discharges; Text analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and applications of Dielectric Materials, 2006. 8th International Conference on
Conference_Location
Bali
Print_ISBN
1-4244-0189-5
Electronic_ISBN
1-4244-0190-9
Type
conf
DOI
10.1109/ICPADM.2006.284150
Filename
4062639
Link To Document