DocumentCode
3247503
Title
A large-grained parallel algorithm for nonlinear eigenvalue problems and its implementation using OmniRPC
Author
Amako, Takeshi ; Yamamoto, Yusaku ; Zhang, Shao-liang
Author_Institution
Dept. of Comput. Sci. & Eng., Nagoya Univ., Nagoya
fYear
2008
fDate
Sept. 29 2008-Oct. 1 2008
Firstpage
42
Lastpage
49
Abstract
The nonlinear eigenvalue problem plays an important role in various fields such as nonlinear elasticity, electronic structure calculation and theoretical fluid dynamics. We recently proposed a new algorithm for the nonlinear eigenvalue problem, which reduces the original problem to a smaller generalized linear eigenvalue problem with Hankel coefficient matrices through complex contour integral. This algorithm has a unique feature that it can find all the eigenvalues in a closed curve on the complex plane. Moreover, it has large-grain parallelism and is suited for execution in a grid environment. In this paper, we study the numerical properties of our algorithm theoretically. In particular, we analyze the effect of numerical integration to the computed eigenvalues and give a guideline on how to choose the size of the Hankel matrices properly. Also, we show the parallel performance of our algorithm implemented on a PC cluster using OmniRPC, a grid RPC system. Parallel efficiency of 75% is achieved when solving a nonlinear eigenvalue problem of order 1000 using 14 processors.
Keywords
Hankel matrices; eigenvalues and eigenfunctions; grid computing; nonlinear equations; parallel algorithms; remote procedure calls; workstation clusters; Hankel matrix; OmniRPC; PC cluster; grid RPC system; grid environment; large-grain parallelism; nonlinear eigenvalue problem; numerical integration; numerical property; parallel algorithm; Algorithm design and analysis; Clustering algorithms; Eigenvalues and eigenfunctions; Elasticity; Fluid dynamics; Guidelines; Jacobian matrices; Newton method; Parallel algorithms; Parallel processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Cluster Computing, 2008 IEEE International Conference on
Conference_Location
Tsukuba
ISSN
1552-5244
Print_ISBN
978-1-4244-2639-3
Electronic_ISBN
1552-5244
Type
conf
DOI
10.1109/CLUSTR.2008.4663754
Filename
4663754
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