DocumentCode
3247695
Title
High Voltage Testing of GIS: Application of Frequency Tuned Resonant Test Sets and Return of Experience from On-site Tests
Author
Schichler, U. ; Wurster, M.
Author_Institution
High Voltage Div., Siemens AG
fYear
2006
fDate
38869
Firstpage
297
Lastpage
300
Abstract
This paper deals with the on-site testing of GIS at high test frequencies generated by frequency tuned resonant test sets. The application of test frequencies of up to 300 Hz (see IEC 62271-203) showed no dependency on the breakdown voltage of the GIS insulation system. The publication also describes modern frequency tuned resonant test sets which enable efficient on-site testing. The return of experience from on-site testing of a state-of-the-art 245 kV GIS population is summarized
Keywords
gas insulated switchgear; insulation testing; switchgear testing; test equipment; tuning; 245 kV; GIS; GIS insulation system; IEC 62271-203; breakdown voltage; frequency tuned resonant test sets; high voltage testing; on-site tests; state-of-the-art; Circuit testing; Dielectrics; Frequency conversion; Geographic Information Systems; Impulse testing; Inductors; Resonance; Resonant frequency; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and applications of Dielectric Materials, 2006. 8th International Conference on
Conference_Location
Bali
Print_ISBN
1-4244-0189-5
Electronic_ISBN
1-4244-0190-9
Type
conf
DOI
10.1109/ICPADM.2006.284175
Filename
4062664
Link To Document