DocumentCode
3247817
Title
Fractal analysis of 3D reconstructed patterns of real electrical tree
Author
Kobayashi, S. ; Maruyama, S. ; Kawai, H. ; Uehara, H. ; Kudo, K.
Author_Institution
Dept. of Electr. Eng., Meiji Univ., Kawasaki, Japan
fYear
1995
fDate
10-13 Jul 1995
Firstpage
299
Lastpage
303
Abstract
In this paper, we studied voltage-dependent characteristics of the tree shapes in cross-linked polyethylene (XLPE). We also studied the effect of voids on the tree shapes. In the case of the voidless samples, the tree length shows nonmonotonic behavior. In the case of samples with recessed voids, the tree length increases with increasing applied voltage. The tree shape is considered to consist of multiple groups of branches
Keywords
XLPE insulation; computerised tomography; fractals; image reconstruction; insulation testing; trees (electrical); voids (solid); 3D reconstructed patterns; XLPE; applied voltage; cross-linked polyethylene; fractal analysis; multiple branch groups; nonmonotonic behavior; real electrical tree; tree length; tree shapes; voidless samples; voids; voltage-dependent characteristics; Computed tomography; Electrodes; Fractals; Microscopy; Needles; Pattern analysis; Polymers; Shape; Statistical analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
Conference_Location
Leicester
Print_ISBN
0-7803-2040-9
Type
conf
DOI
10.1109/ICSD.1995.522997
Filename
522997
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