Title :
Fractal analysis of 3D reconstructed patterns of real electrical tree
Author :
Kobayashi, S. ; Maruyama, S. ; Kawai, H. ; Uehara, H. ; Kudo, K.
Author_Institution :
Dept. of Electr. Eng., Meiji Univ., Kawasaki, Japan
Abstract :
In this paper, we studied voltage-dependent characteristics of the tree shapes in cross-linked polyethylene (XLPE). We also studied the effect of voids on the tree shapes. In the case of the voidless samples, the tree length shows nonmonotonic behavior. In the case of samples with recessed voids, the tree length increases with increasing applied voltage. The tree shape is considered to consist of multiple groups of branches
Keywords :
XLPE insulation; computerised tomography; fractals; image reconstruction; insulation testing; trees (electrical); voids (solid); 3D reconstructed patterns; XLPE; applied voltage; cross-linked polyethylene; fractal analysis; multiple branch groups; nonmonotonic behavior; real electrical tree; tree length; tree shapes; voidless samples; voids; voltage-dependent characteristics; Computed tomography; Electrodes; Fractals; Microscopy; Needles; Pattern analysis; Polymers; Shape; Statistical analysis; Voltage;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1995. ICSD'95., Proceedings of the 1995 IEEE 5th International Conference on
Conference_Location :
Leicester
Print_ISBN :
0-7803-2040-9
DOI :
10.1109/ICSD.1995.522997
