DocumentCode
3247924
Title
A novel model for synthesizing parallel I/O workloads in scientific applications
Author
Feng, Dan ; Zou, Qiang ; Jiang, Hong ; Zhu, Yifeng
Author_Institution
Sch. of Comput., Huazhong Univ. of Sci. & Technol., Wuhan
fYear
2008
fDate
Sept. 29 2008-Oct. 1 2008
Firstpage
252
Lastpage
261
Abstract
One of the challenging issues in performance evaluation of parallel storage systems through synthetic-trace-driven simulation is to accurately characterize the I/O demands of data-intensive scientific applications. This paper analyzes several I/O traces collected from different distributed systems and concludes that correlations in parallel I/O inter-arrival times are inconsistent, either with little correlation or with evident and abundant correlations. Thus conventional Poisson or Markov arrival processes are inappropriate to model I/O arrivals in some applications. Instead, a new and generic model based on the alpha-stable process is proposed and validated in this paper to accurately model parallel I/O burstiness in both workloads with little and strong correlations. This model can be used to generate reliable synthetic I/O sequences in simulation studies. Experimental results presented in this paper show that this model can capture the complex I/O behaviors of real storage systems more accurately and faithfully than conventional models, particularly for the burstiness characteristics in the parallel I/O workloads.
Keywords
distributed memory systems; parallel processing; I/O demand; data-intensive scientific application; distributed system; parallel I/O burstiness; parallel I/O workload; parallel storage system; synthetic-trace-driven simulation; Application software; Computer simulation; Concurrent computing; Data flow computing; Laboratories; Large-scale systems; Mathematical model; Modeling; Parallel processing; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
Cluster Computing, 2008 IEEE International Conference on
Conference_Location
Tsukuba
ISSN
1552-5244
Print_ISBN
978-1-4244-2639-3
Electronic_ISBN
1552-5244
Type
conf
DOI
10.1109/CLUSTR.2008.4663778
Filename
4663778
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