• DocumentCode
    3247924
  • Title

    A novel model for synthesizing parallel I/O workloads in scientific applications

  • Author

    Feng, Dan ; Zou, Qiang ; Jiang, Hong ; Zhu, Yifeng

  • Author_Institution
    Sch. of Comput., Huazhong Univ. of Sci. & Technol., Wuhan
  • fYear
    2008
  • fDate
    Sept. 29 2008-Oct. 1 2008
  • Firstpage
    252
  • Lastpage
    261
  • Abstract
    One of the challenging issues in performance evaluation of parallel storage systems through synthetic-trace-driven simulation is to accurately characterize the I/O demands of data-intensive scientific applications. This paper analyzes several I/O traces collected from different distributed systems and concludes that correlations in parallel I/O inter-arrival times are inconsistent, either with little correlation or with evident and abundant correlations. Thus conventional Poisson or Markov arrival processes are inappropriate to model I/O arrivals in some applications. Instead, a new and generic model based on the alpha-stable process is proposed and validated in this paper to accurately model parallel I/O burstiness in both workloads with little and strong correlations. This model can be used to generate reliable synthetic I/O sequences in simulation studies. Experimental results presented in this paper show that this model can capture the complex I/O behaviors of real storage systems more accurately and faithfully than conventional models, particularly for the burstiness characteristics in the parallel I/O workloads.
  • Keywords
    distributed memory systems; parallel processing; I/O demand; data-intensive scientific application; distributed system; parallel I/O burstiness; parallel I/O workload; parallel storage system; synthetic-trace-driven simulation; Application software; Computer simulation; Concurrent computing; Data flow computing; Laboratories; Large-scale systems; Mathematical model; Modeling; Parallel processing; Production;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cluster Computing, 2008 IEEE International Conference on
  • Conference_Location
    Tsukuba
  • ISSN
    1552-5244
  • Print_ISBN
    978-1-4244-2639-3
  • Electronic_ISBN
    1552-5244
  • Type

    conf

  • DOI
    10.1109/CLUSTR.2008.4663778
  • Filename
    4663778