Title : 
Limits of using signatures for permutation independent Boolean comparison
         
        
            Author : 
Mohnke, Janett ; Molitor, Paul ; Malik, Sharad
         
        
            Author_Institution : 
Inst. fur Inf., Martin-Luther-Univ., Halle-Wittenberg, Germany
         
        
        
            fDate : 
29 Aug-1 Sep 1995
         
        
        
        
            Abstract : 
This paper addresses problems that arise while checking the equivalence of two Boolean functions under arbitrary input permutations. The permutation problem has several applications in the synthesis and verification of combinational logic: it arises in the technology mapping stage of logic synthesis and in logic verification. A popular method to solve it is to compute a signature for each variable that helps to establish a correspondence between the variables. Several researchers have suggested a wide range of signatures that have been used for this purpose. However, for each choice of signature, there remain variables that cannot be uniquely identified. Our research has shown that, for a given example, this set of problematic variables tends to be the same-regardless of the choice of signatures. The paper investigates this problem
         
        
            Keywords : 
Boolean functions; combinational circuits; equivalence classes; logic CAD; logic design; logic testing; Boolean functions; combinational logic; equivalence; logic synthesis; logic verification; permutation independent Boolean comparison; signatures; synthesis; technology mapping; verification; Automatic logic units; Automatic testing; Boolean functions; Circuit synthesis; Data structures; Input variables; Libraries; Logic circuits; Logic testing;
         
        
        
        
            Conference_Titel : 
Design Automation Conference, 1995. Proceedings of the ASP-DAC '95/CHDL '95/VLSI '95., IFIP International Conference on Hardware Description Languages. IFIP International Conference on Very Large Scal
         
        
            Conference_Location : 
Chiba
         
        
            Print_ISBN : 
4-930813-67-0
         
        
        
            DOI : 
10.1109/ASPDAC.1995.486356