• DocumentCode
    3248175
  • Title

    A method for measuring the transverse half-wave voltage of LiNbO3

  • Author

    Jiang Xingfang ; Feng yimin

  • Author_Institution
    Sch. of Math. & Phys., Changzhou Univ., Changzhou, China
  • fYear
    2012
  • fDate
    23-27 July 2012
  • Firstpage
    180
  • Lastpage
    182
  • Abstract
    For revealing the essence of electro-optic effect and measuring the transverse half-wave voltage in LiNbO3 crystal, the strict derivation method from the physical mechanism was put forward and a good method was used. The strict derivation method was from the ellipsoid equation for the light propagation. When LiNbO3 crystal had carried the voltage in transverse the coordinate system did not rotating only the lengths of the main axle were changed. The Taylor expansion was used, the higher order small magnitudes were omitted, and the Pockels effect was deduced. The good method of the experiment was that the maximum putout was 600V for the power supply with a 1/4 wave plate were used under laboratory conditions. The transverse half-wave voltage could be determined 360V. The ratio of the length and thickness of LiNbO3 crystal sample could be judged about 7 was agreed with the practical sample from the theory of strict derivation. The results shown that the methods were suit for measuring the electro-optic characteristics of all electro-optic material.
  • Keywords
    Pockels effect; light propagation; lithium compounds; refractive index; LiNbO3; Pockel effect; Taylor expansion; electro-optic material; electro-optical effect; light propagation; power supply; refractive index ellipsoid equation; transverse half-wave voltage; voltage 360 V; voltage 600 V; Electrooptic modulators; Materials; Electro-optic effects; LiNbO3; electro-optic modulation; half-wave voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cross Strait Quad-Regional Radio Science and Wireless Technology Conference (CSQRWC), 2012
  • Conference_Location
    New Taipei City
  • Print_ISBN
    978-1-4673-1867-9
  • Type

    conf

  • DOI
    10.1109/CSQRWC.2012.6294972
  • Filename
    6294972