Title :
The properties of oxidation growth and overheating by poor contact
Author :
Kim, Dong-Ook ; Kim, Hyang-Kon ; Shong, Kil-Mok ; Choi, Chung-Seog
Author_Institution :
Electr. Safety Res. Inst., Korea Electr. Safety Corp., Kyunggi-Do
Abstract :
In this paper, we experimented the glowing and heating phenomenon at the contacts of copper wires, and studied the breeding process, the growing characteristics of copper oxide according to the diameter of copper wires and AC current. The surface structure, crystalline structure, compositions and calory variation of Cu2O that grew at the contacts of two copper wires were analyzed by using scanning electron microscope (SEM), metallurgical microscope, energy dispersive X-ray spectroscopy (EDX) and differential scanning calorimetry (DSC). As these results, we could know that carbonization and oxidation reaction generated on the outside of the oxide, and only oxidation reaction generated in the inside of the oxide
Keywords :
X-ray chemical analysis; copper compounds; differential scanning calorimetry; electrical contacts; oxidation; scanning electron microscopy; surface composition; wires (electric); Cu2O; EDX; SEM; breeding process; calory variation; carbonization; copper wires; crystalline structure; differential scanning calorimetry; electrical contacts; energy dispersive X-ray spectroscopy; glowing phenomena; metallurgical microscope; overheating phenomena; oxidation growth; scanning electron microscope; surface composition; surface structure; Calorimetry; Copper; Crystallization; Dispersion; Heating; Oxidation; Scanning electron microscopy; Spectroscopy; Surface structures; Wires; Cu2O; DSC; SEM; copper; copper oxide; poor contact;
Conference_Titel :
Properties and applications of Dielectric Materials, 2006. 8th International Conference on
Conference_Location :
Bali
Print_ISBN :
1-4244-0189-5
Electronic_ISBN :
1-4244-0190-9
DOI :
10.1109/ICPADM.2006.284198
