Title :
Prediction of propagation characteristics using a rigorous UTD formula
Author :
Zhang, Y.P. ; Hwang, Y.
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ., Hong Kong
Abstract :
A new diffraction coefficient formula rigorous for a two-impedance wall right-angle wedge is presented. The utility of the rigorous formula is demonstrated through its application to predict propagation in a tunnel NLOS microcellular environment
Keywords :
cellular radio; electric impedance; geometrical theory of diffraction; land mobile radio; radiowave propagation; 1800 MHz; UHF; diffraction coefficient formula; propagation characteristics prediction; radiowave propagation; rigorous UTD formula; tunnel NLOS microcellular environment; two-impedance wall right-angle wedge; Electromagnetic diffraction; Electromagnetic propagation; Geometrical optics; Impedance; Material properties; Optical propagation; Optical reflection; Physical theory of diffraction; Ray tracing; Tellurium;
Conference_Titel :
Vehicular Technology Conference, 1998. VTC 98. 48th IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-4320-4
DOI :
10.1109/VETEC.1998.686647
