Title :
A single-chip 12.5 Gbaud transceiver for serial data communication
Author :
Friedman, D. ; Meghelli, M. ; Parker, Brendon ; Yang, J. ; Ainspan, H. ; Soyuer, M.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
A fully integrated single-chip SiGe BiCMOS 12.5 Gbaud serializer/deserializer operates with sub-picosecond PLL jitter and error rates below 5e-14 with both transmit and receive channels active. The chip includes a 12.5 GHz clock multiplier, a 12.5 Gbaud clock and data recovery circuit, a 16:1 multiplexer, 1:16 demultiplexer, and integrated test features. The die area is 6.1 mm/spl times/6.1 mm and consumes 3.3 W from a 3.3 V supply in normal operating mode.
Keywords :
BiCMOS integrated circuits; Ge-Si alloys; data communication equipment; digital communication; mixed analogue-digital integrated circuits; semiconductor materials; synchronisation; transceivers; 12.5 Gbit/s; 3.3 V; 3.3 W; ASIC; SiGe; SiGe BiCMOS IC; clock multiplier; clock/data recovery circuit; demultiplexer; error rates; integrated test features; multiplexer; serial data communication; serializer/deserializer; single-chip Gbaud transceiver; subpicosecond PLL jitter; BiCMOS integrated circuits; Circuit testing; Clocks; Data communication; Error analysis; Germanium silicon alloys; Jitter; Phase locked loops; Silicon germanium; Transceivers;
Conference_Titel :
VLSI Circuits, 2001. Digest of Technical Papers. 2001 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
4-89114-014-3
DOI :
10.1109/VLSIC.2001.934222
