DocumentCode
3248743
Title
CT saturation calculations - are they applicable in the modern world? - Part III, low-ratio, high-current CT/microprocessor relay comparisons at a high-current testing laboratory
Author
Cossé, Roy E., Jr. ; Dunn, Donald G. ; Spiewak, Robert M. ; Bowen, James E.
Author_Institution
Chevron, Houston, TX
fYear
2008
fDate
22-24 Sept. 2008
Firstpage
1
Lastpage
14
Abstract
Part III is an extension of the Part II testing effort, but with relay manufacturers providing, commissioning, and configuring the relays for the high-current test laboratory activities. Part III provides high-current testing laboratory results for multiple 50 kA and 63 kA tests involving several typical low-ratio switchgear CTpsilas (with typical burdens) and microprocessor feeder relay instantaneous 50 elements. Saturated low-ratio CT graphical waveform plots obtained from a series of tests are analyzed. Microprocessor relay 50 element true rms and bipolar peak detector relay filter algorithm types are considered. Discussions also include power system concerns resulting from delayed microprocessor relay instantaneous 50 element operation, i.e., arc flash PPE recommendations, relay coordination selectivity, equipment. Comments about electro-mechanical instantaneous relays are included.
Keywords
current transformers; microprocessor chips; power distribution protection; power system relaying; power transformer protection; power transformers; relay protection; switchgear protection; switchgear testing; CT saturation calculation; bipolar peak detector relay filter algorithm; current 50 kA; current 63 kA; current transformer; electro-mechanical instantaneous relays; high-current CT/microprocessor feeder relay; high-current testing laboratory; low-ratio switchgear; power system relaying; Circuit faults; Detectors; Fault currents; Laboratories; Manufacturing; Microprocessors; Power system relaying; Relays; Switchgear; Testing; COMTRADE files; Current Transformers (CT); Digital Fault Recorder (DFR); Electromagnetic Transients Program (EMTP) Modeling; High-Current / Primary Injection testing; Intelligent Electronic Device (IED); Secondary Injection testing; Sequence of Event Record (SER);
fLanguage
English
Publisher
ieee
Conference_Titel
Petroleum and Chemical Industry Technical Conference, 2008. PCIC 2008. 55th IEEE
Conference_Location
Cincinnati, OH
ISSN
0090-3507
Print_ISBN
978-1-4244-2520-4
Electronic_ISBN
0090-3507
Type
conf
DOI
10.1109/PCICON.2008.4663966
Filename
4663966
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