Title :
Algebraic error detection: a new approach to concurrent error detection in arithmetic circuits
Author :
Evans, Richard A.
Author_Institution :
Defence Res. Agency, Malvern, UK
fDate :
29 Aug-1 Sep 1995
Abstract :
We present a novel and extremely simple technique for performing concurrent error detection in arithmetic circuits such as those used in Digital Signal Processing (DSP). Our approach, called Algebraic Error Detection, employs the well known concept of time redundancy, but exploits the algebraic properties of the number representation used within the circuit to permit errors to be detected. Within certain constraints, our approach appears to be capable of detecting all errors caused by single stuck-at faults, both permanent and transient, as well as many multiple faults, and may also be applicable to existing DSP chips. We also describe two hardware systems developed to demonstrate the idea
Keywords :
VLSI; digital arithmetic; error detection; logic testing; Algebraic Error Detection; algebraic properties; arithmetic circuits; concurrent error detection; time redundancy; Circuit faults; Digital arithmetic; Digital signal processing; Digital signal processing chips; Electrical fault detection; Fault detection; Hardware; Redundancy; Signal processing; Very large scale integration;
Conference_Titel :
Design Automation Conference, 1995. Proceedings of the ASP-DAC '95/CHDL '95/VLSI '95., IFIP International Conference on Hardware Description Languages. IFIP International Conference on Very Large Scal
Conference_Location :
Chiba
Print_ISBN :
4-930813-67-0
DOI :
10.1109/ASPDAC.1995.486393