DocumentCode :
3248968
Title :
Silicon integrated high performance inductors in a 0.18 /spl mu/m CMOS technology for MMIC
Author :
Heng-Ming Hsu ; Jiong-Guang Su ; Shyh-Chyi Wong ; Yuan-Chen Sun ; Chun-Yen Chang ; Tiao-Yuan Huang ; Tsai, C.C. ; Lin, C.H. ; Liou, R.S. ; Chang, R.Y. ; Yeh, T.H. ; Chen, C.H. ; Huang, C.F. ; Huang, H.D. ; Chen, C.W.
Author_Institution :
Res. Dev. Center, Taiwan Semicond. Manuf. Co., Taiwan
fYear :
2001
fDate :
14-16 June 2001
Firstpage :
199
Lastpage :
200
Abstract :
This paper presents a complete portfolio of silicon integrated inductors in a 0.18 μm CMOS technology. In addition to inductor design, we also present a complete optimization methodology with associated modeling and key characterization. Our inductor quality factors have been enhanced by optimizing patterned ground shield and taper coils or using copper metallization. The quality-factor peak can further be optimized at an application-specific frequency band with our optimization algorithm. To facilitate IC design with inductors, a novel model considering eddy current loss was developed, Finally, to integrate inductors into a system-chip, inductor-to-inductor and substrate-inductor coupling were investigated.
Keywords :
CMOS integrated circuits; MMIC; Q-factor; UHF integrated circuits; circuit optimisation; eddy current losses; electromagnetic coupling; elemental semiconductors; inductors; integrated circuit design; integrated circuit metallisation; integrated circuit modelling; integrated circuit noise; silicon; 0.18 micron; CMOS technology; Cu; Cu metallization; IC design; MMIC; Si; Si integrated inductors; application-specific frequency band; eddy current loss; high performance inductors; inductor modelling; inductor quality factors; inductor-to-inductor coupling; optimization methodology; patterned ground shield; substrate-inductor coupling; system chip; taper coils; CMOS technology; Coils; Copper; Design optimization; Inductors; Integrated circuit modeling; Portfolios; Q factor; Semiconductor device modeling; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits, 2001. Digest of Technical Papers. 2001 Symposium on
Conference_Location :
Kyoto, Japan
Print_ISBN :
4-89114-014-3
Type :
conf
DOI :
10.1109/VLSIC.2001.934237
Filename :
934237
Link To Document :
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