Title :
Probabilistic neural network based tolerance-circuit diagnosis
Author :
Shen, Meie ; Peng, Minfang ; He, Jianbiao ; Xie, Kai
Author_Institution :
Coll. of Comput. Sci., Beijing Univ. of Inf. Sci. & Technol., Beijing, China
Abstract :
An approach to fault diagnosis for analog circuits with tolerance is presented based on probabilistic neural networks. In order to overcome the difficulties in BP network based diagnosis such as slow learning speed for convergence and easily falling into local minimum value, probabilistic neural network is introduced to tolerance-circuit diagnosis. Fault samples including soft faults and hard faults in tolerance circuits are generated by Monte Carlo analysis. Fault features are extracted by using the largest deviation path so as to obtain appropriate training samples. Simulation results show that the proposed diagnosis method has high speed and accurate recognition even for soft faults in circuits with tolerance.
Keywords :
Monte Carlo methods; analogue circuits; backpropagation; electronic engineering computing; fault diagnosis; fault tolerant computing; feature extraction; multilayer perceptrons; BP network based diagnosis; Monte Carlo analysis; analog circuits; deviation path; fault diagnosis; fault feature extraction; hard faults; multilayer perceptron model structure; probabilistic neural network based tolerance-circuit diagnosis; soft faults; tolerance-circuit diagnosis; Australia; Computer science; Analog circuit; Fault diagnosis; Probabilistic Neural Network; Tolerance;
Conference_Titel :
Computer Science & Education (ICCSE), 2012 7th International Conference on
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4673-0241-8
DOI :
10.1109/ICCSE.2012.6295016