DocumentCode
3249086
Title
Probabilistic neural network based tolerance-circuit diagnosis
Author
Shen, Meie ; Peng, Minfang ; He, Jianbiao ; Xie, Kai
Author_Institution
Coll. of Comput. Sci., Beijing Univ. of Inf. Sci. & Technol., Beijing, China
fYear
2012
fDate
14-17 July 2012
Firstpage
13
Lastpage
16
Abstract
An approach to fault diagnosis for analog circuits with tolerance is presented based on probabilistic neural networks. In order to overcome the difficulties in BP network based diagnosis such as slow learning speed for convergence and easily falling into local minimum value, probabilistic neural network is introduced to tolerance-circuit diagnosis. Fault samples including soft faults and hard faults in tolerance circuits are generated by Monte Carlo analysis. Fault features are extracted by using the largest deviation path so as to obtain appropriate training samples. Simulation results show that the proposed diagnosis method has high speed and accurate recognition even for soft faults in circuits with tolerance.
Keywords
Monte Carlo methods; analogue circuits; backpropagation; electronic engineering computing; fault diagnosis; fault tolerant computing; feature extraction; multilayer perceptrons; BP network based diagnosis; Monte Carlo analysis; analog circuits; deviation path; fault diagnosis; fault feature extraction; hard faults; multilayer perceptron model structure; probabilistic neural network based tolerance-circuit diagnosis; soft faults; tolerance-circuit diagnosis; Australia; Computer science; Analog circuit; Fault diagnosis; Probabilistic Neural Network; Tolerance;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science & Education (ICCSE), 2012 7th International Conference on
Conference_Location
Melbourne, VIC
Print_ISBN
978-1-4673-0241-8
Type
conf
DOI
10.1109/ICCSE.2012.6295016
Filename
6295016
Link To Document