• DocumentCode
    3249432
  • Title

    Safety first: Detection of downed conductors and arcing on overhead distribution lines

  • Author

    Adamiak, Mark

  • Author_Institution
    GE Multilin, Wayne, PA
  • fYear
    2008
  • fDate
    22-24 Sept. 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Arcing and/or downed distribution conductors, although not of concern from an equipment damage point of view, do pose a safety threat from a personnel and property perspective. Traditional protection devices typically do not detect the fault current levels resulting from these conductor conditions. The ability to detect High Impedance (HiZ) faults has been a topic of research and development for over 30 years. About ten years ago, products began to appear on the market that could securely perform this function. Over this time period, several hundred HiZ detection devices have been placed in service and have performed to expectations. This paper examines the conductor conditions and resulting currents that are categorized as high-impedance (HiZ) faults and then reviews the HiZ fault detection principles that have evolved over time. Finally, the paper looks at the application issues encountered (both physical and procedural), and highlights experience to date.
  • Keywords
    arcs (electric); electric impedance; electrical safety; fault currents; power distribution faults; power distribution lines; power overhead lines; arcing faults; downed conductor detection; high impedance fault detection; overhead distribution lines; personnel safety; research and development; Conducting materials; Conductors; Contacts; Electrical fault detection; Fault detection; Impedance; Power distribution lines; Power system protection; Power system relaying; Safety; Power distribution faults; arcing fault hazards; arcing faults; arcs (electric); electrical faults; power system faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Petroleum and Chemical Industry Technical Conference, 2008. PCIC 2008. 55th IEEE
  • Conference_Location
    Cincinnati, OH
  • ISSN
    0090-3507
  • Print_ISBN
    978-1-4244-2520-4
  • Electronic_ISBN
    0090-3507
  • Type

    conf

  • DOI
    10.1109/PCICON.2008.4664002
  • Filename
    4664002