Title :
Temperature compensation of transfluxors
Author :
Abbott, H. ; Suran, J.
Author_Institution :
General Electric Co., Syracuse, NY, USA
Abstract :
Provides an abstract of the presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings.
Keywords :
Circuit stability; Coercive force; Coupling circuits; Digital-analog conversion; Ferrites; Pulse circuits; Remanence; Temperature distribution;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1957 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1957.1183956
