Scattering robust features for classification of materials usingl terahertz

Terahertz spectroscopy has emerged as an important tool for identification and classification of materials, which exhibit absorption features at specific and distinct frequency bins in the THz spectrum. The scattering of terahertz radiation from granular substances can significantly distort the spectral fingerprint of the material under study. In this paper we propose a signal processing based technique to mitigate the effects of scattering from the measured terahertz spectrum to produce features that can be used for scattering invariant classification of material using THz-TDS.