DocumentCode :
3249936
Title :
Experimental and simulated generation of bandlimited noise for communication system bit error rate evaluation
Author :
Miller, Damon A. ; Bazuin, Bradley ; Lillrose, Jason ; Tamayo, Paolo ; Grassi, Giuseppe
Author_Institution :
Dept. of Electr. & Comput. Eng., Western Michigan Univ., Kalamazoo, MI, USA
fYear :
2005
fDate :
7-10 Aug. 2005
Firstpage :
139
Abstract :
This paper describes an inexpensive approach to experimentally measure and simulate low frequency communication system bit error rates (BERs). A readily constructed bandlimited noise source and a programmable logic based BER test unit enable experimental BER measurements. A technique proposed by Beaulieu and Tan (1999) is used to generate noise samples based on the bandlimited noise source power spectrum. These noise samples are then used to obtain simulated BER curves for comparison and validation of experimental BER curves. This paper includes an example of using the proposed approach to measure the BER performance of a coherent communication system. Initial results demonstrate the utility of this approach.
Keywords :
bandlimited communication; error statistics; noise generators; phase shift keying; BER measurements; bandlimited noise generation; bit error rate evaluation; coherent communication system; low frequency communication system; programmable logic; Binary phase shift keying; Bit error rate; Circuit noise; Communication systems; Computational modeling; Low-frequency noise; Noise generators; Noise measurement; Noise shaping; Oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2005. 48th Midwest Symposium on
Print_ISBN :
0-7803-9197-7
Type :
conf
DOI :
10.1109/MWSCAS.2005.1594058
Filename :
1594058
Link To Document :
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