Effects of low temperatures on transistor characteristics

This paper reports the results of a number of tests made on a group of PNP alloy junction transistors whose power rating at the usual operating temperature is 30 milliwatts and whose cut-off frequency is about 3 megacycles. The tests show that as the temperature of the transistor is lowered, both the maximum power dissipation and the cut-off frequency are increased, thus making it possible for the rise-time of output pulses and the magnitude of the current output to be considerably improved.