DocumentCode :
3250269
Title :
Macromodel for micromechanical, multi-electrode structures in force feedback control systems
Author :
Handtmann, M. ; Aigner, R. ; Plotz, F. ; Wachutka, G.
Author_Institution :
Infineon Corp. Res., Munich, Germany
fYear :
1999
fDate :
1999
Firstpage :
183
Lastpage :
186
Abstract :
Electrostatic force feedback loops are commonly used for measurement and position control in micromechanical sensors and actuators. They are widely implemented with switched capacitor, sigma-delta (Σ/Δ) architectures as they provide perfect compatibility with capacitive sensing methods. The electromechanical subsystem, as a vital part of a Σ/Δ-loop, strongly influences the loop characteristics. In order to characterize a Σ/Δ-loop, however, transient simulations over a long time period are inevitable. Full 3D physical simulations (FEM/BEM) at system level are numerically impractical. Therefore, effective macromodels of the electro-mechanical subsystem are required. Established macromodels can handle one-dimensional systems and weakly coupled multi-dimensional systems but are not applicable to multidimensional, multi-electrode systems. A novel modeling technique is presented for micromechanical, multi-electrode structures which is based on Lagrange´s equations. It considers the coupling of the structure kinematics with the electrical field between the electrodes. It further reflects parasitic excitation of the mechanical fundamental eigenmodes of the structure. The technique is applied to a new electrostatic levitation system controlling a micromechanical plate
Keywords :
capacitive sensors; electrostatic actuators; finite element analysis; force feedback; kinematics; microelectrodes; microsensors; position control; position measurement; semiconductor device models; sigma-delta modulation; Lagrange´s equations; capacitive sensing; electrical field coupling; electrostatic force feedback loops; electrostatic levitation system; finite element analysis; force feedback control systems; macromodel; mechanical fundamental eigenmodes; micromechanical actuators; micromechanical multielectrode structures; micromechanical plate; micromechanical sensors; parasitic excitation; position control; position measurement; structure kinematics; switched capacitor sigma-delta architectures; Electromechanical sensors; Electrostatic measurements; Force feedback; Force measurement; Force sensors; Micromechanical devices; Multidimensional systems; Position control; Position measurement; Sensor phenomena and characterization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 1999. SISPAD '99. 1999 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
4-930813-98-0
Type :
conf
DOI :
10.1109/SISPAD.1999.799291
Filename :
799291
Link To Document :
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