• DocumentCode
    3250298
  • Title

    An approach to risk events analysis for ERM using AHP and cluster analysis

  • Author

    Pornprasitpol, Pomwan ; Ye, Dan ; Sun, Ming-Bo

  • Author_Institution
    Fac. of Eng. & Inf. Technol., Univ. of Technol., Sydney, NSW, Australia
  • fYear
    2010
  • fDate
    29-31 Oct. 2010
  • Firstpage
    1009
  • Lastpage
    1013
  • Abstract
    An increase in enterprise´s operational risk concerns a broader range of corporate stakeholders. Therefore, there is a need for integrated Enterprise Risk Management (ERM) system, in order to keep the enterprise competitive. There also has been a paucity of practical and effective ERM tools for the analysis of risk events, which is the basis of the ERM system. This paper proposes an approach of using AHP and cluster analysis to enable the identification of the major risks associated with the enterprise´s operation, and the exploration of the relationships among the risk events. In addition, the method of AHP and cluster analysis including its application on ERM is discussed in the paper. A case study has been implemented in order to reinforce the analysis. The results indicate that the method of AHP and cluster analysis can potentially serve as a uniform base for the risk events analysis at the event layer of the ERM. That will provide the management further understanding on the risk events, thus improve their risk management performance.
  • Keywords
    decision making; organisational aspects; risk analysis; statistical analysis; AHP; ERM; cluster analysis; corporate stakeholders; enterprise risk management system; enterprise´s operational risk; risk events analysis; risk identification; Atmospheric measurements; Particle measurements; AHP; Enterprise risk management (ERM); cluster analysis; risk event classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IE&EM), 2010 IEEE 17Th International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6483-8
  • Type

    conf

  • DOI
    10.1109/ICIEEM.2010.5646456
  • Filename
    5646456