• DocumentCode
    3250458
  • Title

    Preparation and Characterization of TiO2-Hybrid SiO2 Porous Film

  • Author

    Liu, Qiang ; Zhu, Zhong-Qi ; Zhang, Jin ; Liu, Qing-Ju ; Chen, Juan

  • Author_Institution
    Yunnan Key Lab. of Nanomater. & Nanotechnol., Yunnan Univ., Kunming, China
  • fYear
    2009
  • fDate
    14-16 Aug. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Porous silicon films are currently under intense investigation for optical, photoelectric, thermal and electronic applications. In this work, the silica films have been prepared by a sol-gel process using a CTAB template. As an improvement, TiO2 was doped in silica sol to produce the TiO2-hybrid SiO2 Porous Film, and the hydrophobic activation of the film was carried out. The chemical and physical changes during sol-gel process were analyzed using DSC-TGA and FTIR. The structure and morphology of films were characterized by XRD and AFM. The experimental results show that the fabricated films have a nano-porous structure. The porous silica film (mean pore size 50 nm) is about 500 nm thick. The mechanical reliability of the film is well, and the contact angle of film is above 90deg after hydrophobic activation.
  • Keywords
    X-ray diffraction; atomic force microscopy; hydrophobicity; porous semiconductors; silicon compounds; sol-gel processing; titanium compounds; AFM; CTAB template; TiO2-SiO2; XRD; hybrid porous film; hydrophobic activation; mechanical reliability; sol-gel process; Chemical analysis; Chemical processes; Ethanol; Optical films; Optical refraction; Optical variables control; Semiconductor films; Silicon compounds; Size control; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronics, 2009. SOPO 2009. Symposium on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-4412-0
  • Type

    conf

  • DOI
    10.1109/SOPO.2009.5230091
  • Filename
    5230091