• DocumentCode
    3250514
  • Title

    Specific Heat and Thermal Conductivity Measurement of XLPE Insulator and Semiconducting Materials

  • Author

    Lee, Kyoung-Yong ; Yang, Jong-Seok ; Choi, Yong Sung ; Park, Dae-Hee

  • Author_Institution
    Sch. of Electr., Electron. & Inf. Eng., Wonkwang Univ., Ihksan
  • fYear
    2006
  • fDate
    38869
  • Firstpage
    805
  • Lastpage
    809
  • Abstract
    To improve mean-life and reliability of power cable, we have investigated specific heat and thermal conductivity of XLPE insulator and semiconducting materials in 154 kV XLPE cable. Specimens were respectively made of sheet form with EVA, EEA and EBA with carbon black 30 wt%, and the other was made of sheet form by cutting XLPE insulator in certain 154 kV power cable. Specific heat and thermal conductivity were measured by DSC (differential scanning calorimetry) and nanoflash diffusivity. Specific-heat measurement temperature ranges of XLPE insulator were from 20 to 90 , and the heating rate was 1/min. And the measurement temperatures of thermal conductivity were 25 ,55 and 90 . In case of semiconducting materials, the measurement temperature ranges of specific heat were from 20 to 60 , and the heating rate was 1/min. And the measurement temperatures of thermal conductivity were 25 and 55 . In addition we measured matrix of semiconducting materials to show formation and growth of carbon black in base resins through the SEM. From these experimental results, both specific heat and thermal conductivity were increased by heating rate because volume of materials was expanded according to rise in temperature
  • Keywords
    XLPE insulation; differential scanning calorimetry; diffusion; power cable insulation; reliability; scanning electron microscopy; semiconductor materials; specific heat; thermal conductivity; 154 kV; DSC; SEM; XLPE insulator; base resins; carbon black; differential scanning calorimetry; ethylene buthyl acrylate; ethylene ethyl acrylate; ethylene vinyl acetate; heating rate; mean-life; nanoflash diffusivity; power cable; reliability; semiconducting materials; specific heat measurement; thermal conductivity; thermal conductivity measurement; Conducting materials; Conductivity measurement; Heating; Insulation; Power cables; Semiconductivity; Semiconductor materials; Sheet materials; Temperature measurement; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and applications of Dielectric Materials, 2006. 8th International Conference on
  • Conference_Location
    Bali
  • Print_ISBN
    1-4244-0189-5
  • Electronic_ISBN
    1-4244-0190-9
  • Type

    conf

  • DOI
    10.1109/ICPADM.2006.284300
  • Filename
    4062789