• DocumentCode
    3250661
  • Title

    Condition-based early stage diagnosis robust ant colony clustering algorithm and feature mapping

  • Author

    Yan, Ji-hong ; Zhao, De-Bin

  • Author_Institution
    Dept. of Ind. Eng., Harbin Inst. of Technol., Harbin, China
  • fYear
    2010
  • fDate
    29-31 Oct. 2010
  • Firstpage
    927
  • Lastpage
    931
  • Abstract
    Performance evaluation is crucial to increasing equipment availability and reliability as well as facilitating further proactive maintenance. This paper presents a novel condition-based early stage diagnosis method using robust ant colony clustering algorithm and feature mapping. Vibration signals acquired from equipments are decomposed by wavelet packet transform after wavelet denoising, and then feature measures based on frequency bands are extracted by ant colony clustering algorithm to form an input vector for training performance evaluation model. Operating conditions of equipment are predicted using feature mapping. Furthermore, a robust ant colony clustering algorithm is proposed to adjust comparison probability dynamically. Finally, effectiveness and feasibility of the proposed method are verified by vibration signals acquired from a drilling test bed.
  • Keywords
    drilling; fault diagnosis; feature extraction; maintenance engineering; pattern clustering; probability; production equipment; reliability; signal denoising; vibrations; wavelet transforms; comparison probability; condition based early stage diagnosis; drilling test bed; equipment availability; equipment reliability; feature extraction; feature mapping; performance evaluation; proactive maintenance; robust ant colony clustering algorithm; vibration signal; wavelet denoising; wavelet packet transform; Heuristic algorithms; Monitoring; Vibration measurement; Vibrations; Performance evaluation; feature mapping; robust ant colony clustering algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IE&EM), 2010 IEEE 17Th International Conference on
  • Conference_Location
    Xiamen
  • Print_ISBN
    978-1-4244-6483-8
  • Type

    conf

  • DOI
    10.1109/ICIEEM.2010.5646474
  • Filename
    5646474