DocumentCode :
3250980
Title :
Ensemble modeling through multiplicative adjustment of class probability
Author :
Hong, Se June ; Hosking, Jonathan ; Natarajan, Ramesh
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
2002
fDate :
2002
Firstpage :
621
Lastpage :
624
Abstract :
We develop a new concept for aggregating items of evidence for class probability estimation. In Naive Bayes, each feature contributes an independent multiplicative factor to the estimated class probability. We modify this model to include an exponent in each factor in order to introduce feature importance. These exponents are chosen to maximize the accuracy of estimated class probabilities on the training data. For Naive Bayes, this modification accomplishes more than what feature selection can. More generally, since the individual features can be the outputs of separate probability models, this yields a new ensemble modeling approach, which we call APM (Adjusted Probability Model), along with a regularized version called APMR.
Keywords :
Bayes methods; data mining; learning (artificial intelligence); probability; very large databases; APMR; Adjusted Probability Model; Naive Bayes; UCI dataset; class probability estimation; data mining; ensemble modeling; feature importance; machine learning data set; multiplicative adjustment; training data; Additives; Bagging; Boosting; Electronic mail; Logistics; Niobium; Parameter estimation; Predictive models; Sections; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining, 2002. ICDM 2003. Proceedings. 2002 IEEE International Conference on
Print_ISBN :
0-7695-1754-4
Type :
conf
DOI :
10.1109/ICDM.2002.1184013
Filename :
1184013
Link To Document :
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