DocumentCode :
3251006
Title :
A non-linear multi-mode control method to improve the transient performance of voltage regulators
Author :
Pan, S. ; Jain, P.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Queen´´s Univ., Kingston, ON
fYear :
2008
fDate :
14-18 Sept. 2008
Firstpage :
1
Lastpage :
6
Abstract :
Digital adaptive voltage positioning (AVP) techniques with fast transient response for voltage regulator modules (VRMs) are proposed in this paper. An AVP control unit is used to achieve AVP, by generating dynamic voltage reference and dynamic current reference. Two digital-to-analog converters therefore can be used instead of analog-to-digital converters to reduce system complexity. A straightforward control law is implemented and no compensator is involved in the control loop, which greatly reduces the computation delay. And non-linear control, which reduces the transient-assertion-to-action delay and maximizes the inductor current slew rate, is used to improve the transient performance. Steady state analysis was performed to demonstrate the digital controller operation. At last, a two-phase 12 V-to-1 V/40 A 250 KHz synchronous buck converter with the proposed digital controller was designed to verify the theoretical analysis by simulations and experiments.
Keywords :
analogue-digital conversion; digital-analogue conversion; nonlinear control systems; transient response; voltage regulators; analog-to-digital converters; digital adaptive voltage positioning techniques; digital-to-analog converters; dynamic current reference; fast transient response; inductor current slew rate; nonlinear multi-mode control method; synchronous buck converter; system complexity; transient-assertion-to-action delay; voltage regulator modules; Analog-digital conversion; Delay; Digital control; Digital-analog conversion; Inductors; Nonlinear dynamical systems; Regulators; Steady-state; Transient response; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Telecommunications Energy Conference, 2008. INTELEC 2008. IEEE 30th International
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-2055-1
Electronic_ISBN :
978-1-4244-2056-8
Type :
conf
DOI :
10.1109/INTLEC.2008.4664087
Filename :
4664087
Link To Document :
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