DocumentCode
3251060
Title
Considering both intra-pattern and inter-pattern anomalies for intrusion detection
Author
Jiang, Ning ; Hua, Kien A. ; Sheu, Simon
Author_Institution
Sch. of EECS, Univ. of Central Florida, Orlando, FL, USA
fYear
2002
fDate
2002
Firstpage
637
Lastpage
640
Abstract
Various approaches have been proposed to discover patterns from system call trails of UNIX processes to better model application behavior. However, these techniques only consider the relationship between system calls (or system audit events). We first refine the definition of maximal patterns given in (Wespi et al., 2000) and provide a pattern extraction algorithm to identify such maximal patterns. We then add one additional dimension to the problem domain by also taking into consideration the overlap relationship between patterns. We argue that an execution path of an application is usually not an arbitrary combination of various patterns; but rather, they overlap each other in some specific order. Such overlap relationship characterizes the normal behavior of the application. Finally, a novel pattern matching module is proposed to detect intrusions based on both intra-pattern and inter-pattern anomalies. We test this idea using the data sets obtained from the University of New Mexico. The experimental results indicate that our scheme detects significantly more anomalies than the scheme presented in (Wespi et al., 2000) while maintaining a very low false alarm rate.
Keywords
Unix; data mining; pattern matching; security of data; very large databases; UNIX; data mining; data sets; experimental results; false alarm rate; inter-pattern anomalies; intra-pattern anomalies; intrusion detection; maximal patterns; pattern extraction algorithm; pattern matching module; system calls; Application software; Computer science; Intrusion detection; Pattern matching; Testing; Windows;
fLanguage
English
Publisher
ieee
Conference_Titel
Data Mining, 2002. ICDM 2003. Proceedings. 2002 IEEE International Conference on
Print_ISBN
0-7695-1754-4
Type
conf
DOI
10.1109/ICDM.2002.1184017
Filename
1184017
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