DocumentCode :
3251070
Title :
An SVR and single response modeling strategy based RPD approach for multiextreme processes
Author :
Cui, Qing-an
Author_Institution :
Inst. of Manage. Eng., Zhengzhou Univ., Zhengzhou, China
fYear :
2010
fDate :
29-31 Oct. 2010
Firstpage :
635
Lastpage :
639
Abstract :
Robust Parameter Design (RPD) is one of the key approaches to improve product quality. The paper proposes an RPD approach for optimizing processes with multiextreme quality characteristics. Firstly, support vector regression (SVR) is selected as the basic fitting model for a concerned process. Secondly, uniform space filling design is used to arrange the levels of control factors and noise factors, and single response modeling strategy is adopted to fit the SVR model. Thirdly, process mean and variance are estimated according to the probability density function of noise factors. Lastly, RPD is achieved by solving the optimal problem. The results of a simulation study for the larger-the-better problem show that, compared with dual response surface methodology, the proposed approach can well reconstruct the multiextreme response surfaces of process mean and variance and obtain global optimal solution of RPD with higher accuracy, all of which demonstrate the superiority of the proposed approach.
Keywords :
design for quality; product design; production engineering computing; quality control; regression analysis; support vector machines; dual response surface methodology; multiextreme process; probability density function; process mean; process variance; product quality; robust parameter design; single response modeling strategy; support vector regression; uniform space filling design; Computers; Robustness; Design of experiments; quality management; robust parameter design; support vector regression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management (IE&EM), 2010 IEEE 17Th International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-4244-6483-8
Type :
conf
DOI :
10.1109/ICIEEM.2010.5646491
Filename :
5646491
Link To Document :
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