Title :
SNR test for /spl Sigma//spl Delta/ modulators using DC levels
Author :
Gonzalez-Diaz, Victor Rodolfo ; Flores-Verdad, Guillermo Espinosa
Author_Institution :
National Inst. for Astrophys., Opt. & Electron., Puebla
Abstract :
A new way to estimate the signal-to-noise ratio in SigmaDelta modulators is presented. It showed how using DC levels at the input of the modulator it is possible to predict its dynamic performance. This proposed scheme is suitable for an all digital BIST scheme which can be useful during wafer sort
Keywords :
built-in self test; circuit noise; circuit testing; sigma-delta modulation; DC level; SNR test; SigmaDelta modulators; all digital BIST scheme; signal-to-noise ratio; Circuit testing; Delta modulation; Filters; Frequency estimation; Performance evaluation; Power generation; Signal generators; Signal resolution; Signal to noise ratio; Switches;
Conference_Titel :
Circuits and Systems, 2005. 48th Midwest Symposium on
Conference_Location :
Covington, KY
Print_ISBN :
0-7803-9197-7
DOI :
10.1109/MWSCAS.2005.1594123
