DocumentCode
3251117
Title
SNR test for /spl Sigma//spl Delta/ modulators using DC levels
Author
Gonzalez-Diaz, Victor Rodolfo ; Flores-Verdad, Guillermo Espinosa
Author_Institution
National Inst. for Astrophys., Opt. & Electron., Puebla
fYear
2005
fDate
7-10 Aug. 2005
Firstpage
405
Abstract
A new way to estimate the signal-to-noise ratio in SigmaDelta modulators is presented. It showed how using DC levels at the input of the modulator it is possible to predict its dynamic performance. This proposed scheme is suitable for an all digital BIST scheme which can be useful during wafer sort
Keywords
built-in self test; circuit noise; circuit testing; sigma-delta modulation; DC level; SNR test; SigmaDelta modulators; all digital BIST scheme; signal-to-noise ratio; Circuit testing; Delta modulation; Filters; Frequency estimation; Performance evaluation; Power generation; Signal generators; Signal resolution; Signal to noise ratio; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2005. 48th Midwest Symposium on
Conference_Location
Covington, KY
Print_ISBN
0-7803-9197-7
Type
conf
DOI
10.1109/MWSCAS.2005.1594123
Filename
1594123
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