Title :
Field emission from microstructured cesiated surfaces
Author_Institution :
Inst. fur Allgemeine Elektrotech. und Elektronik, Tech. Univ. Wien, Austria
fDate :
July 30 1995-Aug. 3 1995
Abstract :
The existence of both a stable and unstable field emission mode from microstructured cesiated surfaces had been proven. Whether the first mode is of importance to vacuum microelectronics is a question which needs further investigation; the second mode seems to be of importance for regenerative and undestroyable field electron sources with possible applications in pulsed power technology.
Keywords :
cathodes; electron field emission; pulsed power technology; stability; vacuum microelectronics; work function; Cs; field electron sources; field emission mode; microstructured cesiated surfaces; pulsed power technology; stable mode; unstable mode; vacuum microelectronics; Atomic measurements; Cathodes; Coatings; Electron emission; Electron sources; Explosives; Ionization; Needles; Propulsion; Substrates;
Conference_Titel :
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-2143-X
DOI :
10.1109/IVMC.1995.487014
