DocumentCode :
3251450
Title :
Fabrication of silicon field emitter by forming porous silicon
Author :
Donghwan Kim ; Sang Jik Kwon ; Jong Duk Lee ; Won, J.H.
Author_Institution :
Dept. of Electron. Eng., Seoul Nat. Univ., South Korea
fYear :
1995
fDate :
July 30 1995-Aug. 3 1995
Firstpage :
176
Lastpage :
180
Abstract :
Silicon field emitter array has been fabricated using porous silicon formation in HF solution. Porous silicon layers are formed on n-type silicon wafer with n/sup +/ layer and p-type silicon wafer in order to make tips. Then, the porous silicon layer is thermally oxidized to be used as an insulator between the gate metal and the silicon substrate. The anode currents of 130 nA per tip and 1 nA per tip are obtained at a gate voltage of 100 V for the n-type emitter and the p-type emitter, respectively. The gate current is less than 0.5% of the anode current for both types.
Keywords :
electron field emission; elemental semiconductors; etching; oxidation; porous materials; semiconductor technology; silicon; vacuum microelectronics; 1 nA; 100 V; 130 nA; HF; HF solution; Si; Si field emitter array; Si-SiO/sub 2/; field emitter fabrication; n-type Si wafer; n-type emitter; n/sup +/ layer; p-type Si wafer; p-type emitter; porous Si formation; porous semiconductor; thermal oxidation; Anodes; Current density; Etching; Fabrication; Field emitter arrays; Hafnium; Insulation; Leakage current; Silicon; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-2143-X
Type :
conf
DOI :
10.1109/IVMC.1995.487019
Filename :
487019
Link To Document :
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