DocumentCode :
32515
Title :
Contactless radio frequency probes for high-temperature characterisation of microwave integrated circuits
Author :
Jordan, J.L. ; Simons, Rainee N. ; Zorman, C.A.
Author_Institution :
NASA Glenn Res. Center, Cleveland, OH, USA
Volume :
50
Issue :
11
fYear :
2014
fDate :
May 22 2014
Firstpage :
817
Lastpage :
819
Abstract :
The first ever demonstration of a viable contactless radio frequency (RF) probing technique at elevated temperatures is presented. The design utilises an inverted microstrip design for the probe, which is suspended over and placed in close proximity to the input/output microstrip lines of the device under test to couple signals in and out. To demonstrate the efficacy of the contactless RF probing technique, three example circuits, namely, a microstrip spurline bandstop filter, a microstrip pin diode series switch and a monolithic microwave integrated circuit amplifier mounted on a microstrip line were designed, fabricated and performance measured against temperature upto 200°C.
Keywords :
MMIC amplifiers; band-stop filters; microstrip lines; microwave integrated circuits; p-i-n diodes; DUT; MMIC amplifier; contactless RF probing technique; contactless radio frequency probing technique; device under test; input-output microstrip lines; inverted microstrip design; microstrip PIN diode series switch; microstrip spurline bandstop filter; microwave integrated circuits;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2014.1009
Filename :
6824372
Link To Document :
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