Title :
Statistical model of cathodes with limited emissive resource
Author :
Golubentsev, A.F. ; Anikin, V.M.
Author_Institution :
Dept. of Phys., Saratov State Univ., Russia
fDate :
July 30 1995-Aug. 3 1995
Abstract :
The Markov probabilistic model of emissive fluctuations and degradation for an emissive area with the "limited emissive resource" is presented. The relationships between characteristics of the emissive fluctuations and the reliability for such an emitter are obtained.
Keywords :
Markov processes; cathodes; electron emission; Markov probabilistic model; cathodes; degradation; emissive fluctuations; limited emissive resource; reliability; statistical model; Cathodes; Degradation; Electron emission; Equations; Fluctuations; Physics; Probability;
Conference_Titel :
Vacuum Microelectronics Conference, 1995. IVMC., 1995 International
Conference_Location :
Portland, OR, USA
Print_ISBN :
0-7803-2143-X
DOI :
10.1109/IVMC.1995.487035
